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1

The single-event effect evaluation technology for nano integrated circuits

Zheng, Hongchao, Zhao, Yuanfu, Yue, Suge, Fan, Long, Du, Shougang, Chen, Maoxin, Yu, Chunqing

Journal:

Journal of Semiconductors

Year:

2015

Language:

english

File:

PDF, 531 KB

english, 2015

2

Modeling and simulation of single-event effect in CMOS circuit

Yue, Suge, Zhang, Xiaolin, Zhao, Yuanfu, Liu, Lin, Wang, Hanning

Journal:

Journal of Semiconductors

Year:

2015

Language:

english

File:

PDF, 3.45 MB

english, 2015

3

[IEEE 2008 IEEE International Symposium on Circuits and Systems - ISCAS 2008 - Seattle, WA, USA (2008.05.18-2008.05.21)] 2008 IEEE International Symposium on Circuits and Systems - A low-voltage CMOS low-dropout regulator with novel capacitor-multiplier frequency compensation

Zushu Yan,, Liangguo Shen,, Yuanfu Zhao,, Suge Yue,

Year:

2008

Language:

english

File:

PDF, 340 KB

english, 2008

4

[IEEE 2006 IEEE North-East Workshop on Circuits and Systems - Gatineau, QC, Canada (2006.6.18-2006.6.18)] 2006 IEEE North-East Workshop on Circuits and Systems - Frequency Compensation for Multistage Amplifiers Using Active-Feedback Current Buffers

Yan, Zushu, Bian, Qiang, Zhao, Yuanfu, Yue, Suge

Year:

2006

Language:

english

File:

PDF, 345 KB

english, 2006

5

[IEEE 2011 IEEE 9th International Conference on Dependable, Autonomic and Secure Computing (DASC) - Sydney, Australia (2011.12.12-2011.12.14)] 2011 IEEE Ninth International Conference on Dependable, Autonomic and Secure Computing - Analysis of the New Latchup Model for Deep Sub-micron Integrated Circuits

Dong, Pan, Fan, Long, Yue, Suge, Zheng, Hongchao, Du, Shougang

Year:

2011

Language:

english

File:

PDF, 511 KB

english, 2011

6

[IEEE 2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM) - Nanjing (2017.11.8-2017.11.11)] 2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM) - Design of a novel 12T radiation hardened memory cell tolerant to single event upsets (SEU)

Hu, Chunyan, Yue, Suge, Lu, Shijin

Year:

2017

Language:

english

File:

PDF, 291 KB

english, 2017

7

[IEEE 2019 IEEE 3rd Information Technology, Networking, Electronic and Automation Control Conference (ITNEC) - Chengdu, China (2019.3.15-2019.3.17)] 2019 IEEE 3rd Information Technology, Networking, Electronic and Automation Control Conference (ITNEC) - A Low-Jitter 10GHz PLL Based on Adaptive Bandwidth Technique for Muti-Rate Serial Link Data Transmitter

Liu, Yajiao, Yue, Suge, Han, Xupeng, Liu, Jiaqi

Year:

2019

Language:

english

File:

PDF, 143 KB

english, 2019

8

Single Event Effect Characterization of High Speed Serial JESD204B Data Receiver

Li, Junze, Yue, Suge, Chen, Maoxin, Song, Xiaojing

Journal:

Journal of Physics Conference Series

Year:

2019

File:

PDF, 778 KB

2019

9

[IEEE 2020 IEEE 3rd International Conference on Electronics Technology (ICET) - Chengdu, China (2020.5.8-2020.5.12)] 2020 IEEE 3rd International Conference on Electronics Technology (ICET) - Research on Pulsed Laser Induced Single Event Effect for High-Speed Serial Interface

Li, Junze, Yue, Suge, Chen, Maoxin, Song, Xiaojing

Year:

2020

File:

PDF, 7.09 MB

2020

10

[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - Impact of Synthesis Constraints on Error Propagation Probability of Digital Circuits

Limbrick, Daniel B., Yue, Suge, Robinson, William H., Bhuva, Bharat L.

Year:

2011

Language:

english

File:

PDF, 345 KB

english, 2011

11

[IEEE 2007 14th IEEE International Conference on Electronics, Circuits and Systems (ICECS '07) - Marrakech (2007.12.11-2007.12.14)] 2007 14th IEEE International Conference on Electronics, Circuits and Systems - Capacitor-Multiplier Frequency Compensation for Low-Power Multistage Amplifiers

Yan, Zushu, Shen, Liangguo, Zhao, Yuanfu, Yue, Suge

Year:

2007

Language:

english

File:

PDF, 419 KB

english, 2007

12

[IEEE 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Hong Kong, China (2008.01.23-2008.01.25)] 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - An Efficient Design of Single Event Transients Tolerance for Logic Circuits

Mo, Yantu, Yue, Suge

Year:

2008

Language:

english

File:

PDF, 443 KB

english, 2008

13

Frequency Effect on SEU of D Flip-Flop

Dong, Pan, Fan, Long, Zheng, Hong Chao, Yue, Suge

Journal:

Applied Mechanics and Materials

Year:

2011

Language:

english

File:

PDF, 680 KB

english, 2011

14

[IEEE 8th International Symposium on Quality Electronic Design (ISQED'07) - San Jose, CA, USA (2007.03.26-2007.03.28)] 8th International Symposium on Quality Electronic Design (ISQED'07) - An SEU-Tolerant Programmable Frequency Divider

Wang, Liang, Yue, Suge, Zhao, Yuanfu, Fan, Long

Year:

2007

Language:

english

File:

PDF, 258 KB

english, 2007

15

[IEEE 2007 International Conference on Microwave and Millimeter Wave Technology - Guilin, China (2007.04.18-2007.04.21)] 2007 International Conference on Microwave and Millimeter Wave Technology - Low-Overhead SEU-Tolerant Latches

Wang, Liang, Yue, Suge, Zhao, Yuanfu

Year:

2007

Language:

english

File:

PDF, 2.13 MB

english, 2007

16

[IEEE 2010 IEEE International Integrated Reliability Workshop (IIRW) - S. Lake Tahoe, CA, USA (2010.10.17-2010.10.21)] 2010 IEEE International Integrated Reliability Workshop Final Report - 3D simulation of charge collection and SEU of 0.13µm partially depleted SOI SRAM

Zhang, Xiaochen, Yue, Suge, Wang, Liang, Li, Jiancheng

Year:

2010

Language:

english

File:

PDF, 472 KB

english, 2010

17

[IEEE 2011 International Semiconductor Device Research Symposium (ISDRS) - College Park, MD, USA (2011.12.7-2011.12.9)] 2011 International Semiconductor Device Research Symposium (ISDRS) - New latch-up model for deep sub-micron integrated circuit

Don, Pan, Fan, Long, Yue, Suge, Zheng, Hongchao, Du, Shougang

Year:

2011

Language:

english

File:

PDF, 172 KB

english, 2011

18

[IEEE 2007 9th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2007) - Deauville, France (2007.09.10-2007.09.14)] 2007 9th European Conference on Radiation and Its Effects on Components and Systems - Single event effects on hard-by-design latches

Liang Wang,, Yuhong Li,, Suge Yue,, Yuanfu Zhao,, Long Fan,, Liquan Liu,

Year:

2007

Language:

english

File:

PDF, 2.31 MB

english, 2007

19

[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - A Monte Carlo-based control signal generator for single event effetc (SEE) fault injection

Zheng, Hongchao, Fan, Long, Yue, Suge, Liu, Liquan

Year:

2009

Language:

english

File:

PDF, 402 KB

english, 2009

20

[IEEE 2008 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, China (2008.12.8-2008.12.10)] 2008 IEEE International Conference on Electron Devices and Solid-State Circuits - ESD device simulation in a pre-Si phase

Zhiguo Li,, Suge Yue,

Year:

2008

Language:

english

File:

PDF, 403 KB

english, 2008

21

[IEEE 2010 IEEE Nanotechnology Materials and Devices Conference (NMDC) - Monterey, CA, USA (2010.10.12-2010.10.15)] 2010 IEEE Nanotechnology Materials and Devices Conference - 3D Simulation of transient current and charge collection induced by heavy ion in SOI transistors

Zhang, Xiaochen, Yue, Suge, Wang, Liang

Year:

2010

Language:

english

File:

PDF, 311 KB

english, 2010

22

[IEEE 2008 IEEE International Symposium on Parallel and Distributed Processing with Applications (ISPA) - Sydney, Australia (2008.12.10-2008.12.12)] 2008 IEEE International Symposium on Parallel and Distributed Processing with Applications - FITVS: A FPGA-Based Emulation Tool For High-Efficiency Hardness Evaluation

Zheng, Hongchao, Fan, Long, Yue, Suge

Year:

2008

Language:

english

File:

PDF, 1.27 MB

english, 2008

23

[IEEE Electronics (PrimeAsia) - Shanghai, China (2009.01.19-2009.01.21)] 2009 Asia Pacific Conference on Postgraduate Research in Microelectronics & Electronics (PrimeAsia) - GDNMOS design for ESD protection in submicron CMOS VLSI

Li, Zhiguo, Suge, Yue, Yongshu, Sun

Year:

2009

Language:

english

File:

PDF, 1.37 MB

english, 2009

24

[IEEE 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Oxford, United Kingdom (2013.9.23-2013.9.27)] 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Single event transients of scan flip-flop and an SET-immune redundant delay filter (RDF)

Zhao, Xinyuan, Wang, Liang, Yue, Suge

Year:

2013

Language:

english

File:

PDF, 1.21 MB

english, 2013

25

[IEEE 2011 IEEE 9th International Conference on Dependable, Autonomic and Secure Computing (DASC) - Sydney, Australia (2011.12.12-2011.12.14)] 2011 IEEE Ninth International Conference on Dependable, Autonomic and Secure Computing - New Latch-Up Model for Deep Sub-micron Integrated Circuits

Dong, Pan, Fan, Long, Yue, Suge, Zheng, Hongchao, Du, Shougang

Year:

2011

Language:

english

File:

PDF, 453 KB

english, 2011

26

[IEEE 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC 2009) - Xi'an (2009.12.25-2009.12.27)] 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Power rail ESD circuit simulation and verification

Li Zhiguo,, Yue Suge,, Sun Yongshu,

Year:

2009

Language:

english

File:

PDF, 4.55 MB

english, 2009

27

[IEEE 2009 Fifth International Joint Conference on INC, IMS and IDC - Seoul, South Korea (2009.08.25-2009.08.27)] 2009 Fifth International Joint Conference on INC, IMS and IDC - 3D Simulation of Charge Collection and MNU in Highly-Scaled SRAM Design

Lin, Liu, Yuanfu, Zhao, Suge, Yue

Year:

2009

Language:

english

File:

PDF, 453 KB

english, 2009

28

[IEEE 2014 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Chengdu, China (2014.6.18-2014.6.20)] 2014 IEEE International Conference on Electron Devices and Solid-State Circuits - Impact of gate shapes on single event transients

Zhao Xinyuan,, Wang liang,, Yue Suge,

Year:

2014

Language:

english

File:

PDF, 428 KB

english, 2014

29

SEU and SET of 65 Bulk CMOS Flip-flops and Their Implications for RHBD

Zhao, Yuanfu, Wang, Liang, Yue, Suge, Wang, Dan, Zhao, Xinyuan, Sun, Yongshu, Li, Dongqiang, Wang, Fuqing, Yang, Xiaoqian, Zheng, Hongchao, Ma, Jianhua, Fan, Long

Journal:

IEEE Transactions on Nuclear Science

Year:

2015

Language:

english

File:

PDF, 821 KB

english, 2015

30

[IEEE 2010 Second International Conference on Communication Systems, Networks and Applications (ICCSNA) - Hong Kong, China (2010.06.29-2010.07.1)] 2010 Second International Conference on Communication Systems, Networks and Applications - Highly-scaled SRAM immunity to MNU based on analysis of an induced parasitic bipolar effect

Lin Liu,, Yuanfu Zhao,, Suge Yue,, Jiancheng Li,, Shijing Lu,, Yantu Mo,, Longjie Su,, Xiaocheng Zhang,

Year:

2010

Language:

english

File:

PDF, 908 KB

english, 2010

31

[IEEE 2015 China Semiconductor Technology International Conference (CSTIC) - Shanghai, China (2015.3.15-2015.3.16)] 2015 China Semiconductor Technology International Conference - A wide input voltage range, output-capacitorless linear voltage regulator in 0.25UM BCD process

Danhui Wang,, Yuanfu Zhao,, Suge Yue,

Year:

2015

Language:

english

File:

PDF, 1.68 MB

english, 2015

32

[IEEE 2016 China Semiconductor Technology International Conference (CSTIC) - Shanghai, China (2016.3.13-2016.3.14)] 2016 China Semiconductor Technology International Conference (CSTIC) - A 0.996mW 10GHz slicer with 20mV input resolution in 65nm CMOS

Chen, Yanan, Yue, Suge, Bian, Qiang, Shi, Fei

Year:

2016

Language:

english

File:

PDF, 290 KB

english, 2016

33

Single event soft error in advanced integrated circuit

Zhao, Yuanfu, Yue, Suge, Zhao, Xinyuan, Lu, Shijin, Bian, Qiang, Wang, Liang, Sun, Yongshu

Journal:

Journal of Semiconductors

Year:

2015

Language:

english

File:

PDF, 1.34 MB

english, 2015

34

The investigation on sensitive mapping of memory cell in microprocessor

Yu, Chunqing, Fan, Long, Yue, Suge, Chen, Maoxin, Du, Shougang, Zheng, Hongchao

Journal:

Journal of Semiconductors

Year:

2015

Language:

english

File:

PDF, 2.93 MB

english, 2015

35

A prediction technique for single-event effects on complex integrated circuits

Zhao, Yuanfu, Yu, Chunqing, Fan, Long, Yue, Suge, Chen, Maoxin, Du, Shougang, Zheng, Hongchao

Journal:

Journal of Semiconductors

Year:

2015

Language:

english

File:

PDF, 376 KB

english, 2015

36

Experimental research on transient radiation effects in microprocessors based on SPARC-V8 architecture

Zhao, Yuanfu, Zheng, Hongchao, Fan, Long, Yue, Suge, Chen, Maoxin, Du, Shougang

Journal:

Journal of Semiconductors

Year:

2015

Language:

english

File:

PDF, 2.58 MB

english, 2015

37

A four-interleaving HBD SRAM cell based on dual DICE for multiple node collection mitigation

Liu, Lin, Yue, Suge, Lu, Shijin

Journal:

Journal of Semiconductors

Year:

2015

Language:

english

File:

PDF, 1.27 MB

english, 2015

38

[IEEE 2016 International Conference on Control, Decision and Information Technologies (CoDIT) - Saint Julian's, Malta (2016.4.6-2016.4.8)] 2016 International Conference on Control, Decision and Information Technologies (CoDIT) - A 8.0Gb/s source-series-terminated transmitter driver with 3 tap FFE for multi-standard applications in 65 nm CMOS

Chen, Yanan, Yue, Suge, Bian, Qiang, Shi, Fei

Year:

2016

Language:

english

File:

PDF, 339 KB

english, 2016

39

Predictions for proton and heavy ions induced SEUs in 65 nm SRAMs

Du, Shougang, Yue, Suge, Liu, Hongxia, Fan, Long, Zheng, Hongchao

Journal:

Journal of Semiconductors

Year:

2015

Language:

english

File:

PDF, 259 KB

english, 2015

40

Single event transient pulse width measurement of 65-nm bulk CMOS circuits

Yue, Suge, Zhang, Xiaolin, Zhao, Xinyuan

Journal:

Journal of Semiconductors

Year:

2015

Language:

english

File:

PDF, 447 KB

english, 2015

41

Analysis and RHBD technique of single event transients in PLLs

Han, Zhiwei, Wang, Liang, Yue, Suge, Han, Bing, Du, Shougang

Journal:

Journal of Semiconductors

Year:

2015

Language:

english

File:

PDF, 1.02 MB

english, 2015

42

Evaluation of SEE on a 32-bit Microprocessor by Laser Test and Heavy Ion Test

Yu, Chun Qing, Fan, Long, Yue, Suge, Ma, Jian Hua, Zheng, Hong Chao

Journal:

Advanced Materials Research

Year:

2015

Language:

english

File:

PDF, 1.66 MB

english, 2015

43

Total Ionizing Dose Influence on the Single Event Multiple-Cell Upsets in 65nm 6-T SRAM

Zheng, Qiwen, Cui, Jiangwei, Lu, Wu, Guo, Hongxia, Liu, Jie, Yu, Xuefeng, Wang, Liang, Liu, Jiaqi, He, Chengfa, Ren, Diyuan, Yue, Suge, Zhao, Yuanfu, Guo, Qi

Journal:

IEEE Transactions on Nuclear Science

Year:

2018

Language:

english

File:

PDF, 542 KB

english, 2018

44

A Fast-Lock Low-Jitter PLL Based Adaptive Bandwidth Technique

Liu, Yajiao, Yue, Suge, Han, Xupeng, Liu, Jiaqi

Journal:

Journal of Physics Conference Series

Year:

2018

Language:

english

File:

PDF, 654 KB

english, 2018

45

[IEEE 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Geneva, Switzerland (2017.10.2-2017.10.6)] 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Single-Event Transient Analysis and Hardening in a 180 nm CMOS Embedded Low-Dropout Regulator

Wang, Liang, Han, Xupeng, Zhao, Yuanfu, Bian, Qiang, Yue, Suge, Lu, Shijin, Shu, Lei, Liu, Jiaqi, Li, Tongde

Year:

2017

Language:

english

File:

PDF, 464 KB

english, 2017